ISO 6342:2003
Micrographics — Aperture cards — Method of measuring thickness of buildup area
OVERVIEW
ISO 6342:2003 specifies a method of measuring the thickness of the buildup area on aperture cards (camera and copy cards) for manufacturing and inspection purposes.
COMMENTS
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PRODUCT DETAILS
| Status | Current |
|---|---|
| Edition | 2003 |
| No. of Pages | 3 |
| ICS Classification | 37.080 Document imaging applications |
| Committee | ISO/TC 171 |
| Available for Purchase | For sale in Singapore only |
| Adoption | ISO |