ISO 21222:2020
Surface chemical analysis — Scanning probe microscopy — Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
OVERVIEW
This document describes a procedure for the determination of elastic modulus for compliant materials using atomic force microscope (AFM). Force-distance curves on the surface of compliant materials are measured and the analysis uses a two-point method based on Johnson-Kendall-Roberts (JKR) theory. This document is applicable to compliant materials with elastic moduli ranging from 100 kPa to 1 GPa. The spatial resolution is dependent on the contact radius between the AFM probe and the surface and is typically approximately10-20 nm.
COMMENTS
-
PRODUCT DETAILS
| Status | Current |
|---|---|
| Edition | 2020 |
| No. of Pages | 17 |
| ICS Classification | 71.040.40 Chemical analysis |
| Committee | ISO/TC 201/SC 9 |
| Available for Purchase | For sale in Singapore only |
| Adoption | ISO |