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44 publications found under ""

IEC 60147-0:1966 [Withdrawn]

Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 0: General and terminology

IEC 60147-0B:1969 [Withdrawn]

Supplement B - Essential ratings and characteristics et semiconductor devices and general principles of measuring methods - Part 0: General and terminology

IEC 60147-0C:1973 [Withdrawn]

Supplement C - Essential ratings and characteristics et semiconductor devices and general principles of measuring methods - Part 0: General and terminology

IEC 60147-0F:1982 [Withdrawn]

Supplement F - Essential ratings and characteristics et semiconductor devices and general principles of measuring methods - Part 0: General and terminology

IEC 60147-1:1963 [Revised]

Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 1: Essential ratings and characteristics

IEC 60147-1:1972 [Withdrawn]

Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 1: Essential ratings and characteristics

IEC 60147-1B:1969 [Revised]

Supplement B - Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 1: Essential ratings and characteristics

IEC 60147-1D:1972 [Revised]

Supplement D - Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 1: Essential ratings and characteristics

IEC 60147-1E:1973 [Current]

Supplement E - Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 1: Essential ratings and characteristics

IEC 60147-1F:1973 [Withdrawn]

Supplement F - Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 1: Essential ratings and characteristics

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