FAQs
IEC 60749-32:2002/COR1:2003
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 32:...
IEC 60749-31:2002/COR1:2003
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 31:...
IEC 60749-27:2006+AMD1:2012 CSV
Semiconductor devices - Mechanical and climatic test methods - Part27: Electrostatic discharge...
IEC 60749-23:2004+AMD1:2011 CSV
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature...
IEC 60749-22:2002/COR1:2003
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 22: Bond...
IEC 60749-2:2002/COR1:2003
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air...
IEC 60749-19:2003+AMD1:2010 CSV
Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength
IEC 60749-11:2002/COR2:2003
Corrigendum 2 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid...
IEC 60749-11:2002/COR1:2003
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid...
