IEC 61967-6:2002/AMD1:2008
Amendment 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
OVERVIEW
COMMENTS
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PRODUCT DETAILS
| Status | Current |
|---|---|
| Edition | 2008 |
| No. of Pages | 40 |
| ICS Classification | 31.200 Integrated circuits. Microelectronics |
| Committee | TC 47/SC 47A |
| Available for Purchase | For sale in Singapore only |
| Adoption | IEC |