IEC 60444-11:2010
Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency f<sub>L</sub> and the effective load capacitance C<sub>Leff</sub> using automatic network analyzer techniques and error correction
OVERVIEW
IEC 60444-11:2010 defines the standard method of measuring load resonance frequency fL at the nominal value of CL, and the determination of the effective load capacitance CLeff at the nominal frequency for crystals with the figure of merit M > 4.
COMMENTS
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PRODUCT DETAILS
Status | Current |
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Edition | 2010 |
No. of Pages | 28 |
ICS Classification | 31.140 Piezoelectric devices |
Committee | TC 49 |
Available for Purchase | For sale in Singapore only |
Adoption | IEC |