IEC 60147-2:1963
Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 2: General principles of measuring methods
OVERVIEW
Gives information based on current practice on measurements of certain device parameters and deals primarily with the parameters listed in IEC 147-1. It is intended that it will be eventually extended to cover all these parameters. This publication deals with transistors only.
COMMENTS
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PRODUCT DETAILS
| Status | Withdrawn - 02 Jan 2026 |
|---|---|
| Edition | 1963 |
| No. of Pages | 55 |
| ICS Classification | 31.080.10 Diodes |
| Committee | TC 47 |
| Available for Purchase | For sale in Singapore only |
| Adoption | IEC |