IEC 62969-4:2018

Semiconductor devices - Semiconductor interface for automotive vehicles - Part 4: Evaluation method of data interface for automotive vehicle sensors

OVERVIEW

IEC 62969-4:2018 specifies a method of directly fault injection test for automotive semiconductor sensor interface that can be used to support the conformance assurance in the vehicle communications interface.

COMMENTS

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PRODUCT DETAILS

Status Current
Edition 2018
No. of Pages 39
ICS Classification 31.080.99 Other semiconductor devices
Committee TC 47
Available for Purchase For sale in Singapore only
Adoption IEC