IEC 61445:2012
Digital Test Interchange Format (DTIF)
OVERVIEW
IEC 61445:2012(E) defines the information content and the data formats for the interchange of digital test program data between DATPGs and automatic test equipment (ATE) for board-level printed circuit assemblies. This information can be broadly grouped into data that defines the following:
a) UUT Model;
b) Stimulus and Response;
c) Fault Dictionary;
d) Probe.
COMMENTS
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PRODUCT DETAILS
| Status | Current |
|---|---|
| Edition | 2012 |
| No. of Pages | 101 |
| ICS Classification | 35.060 Languages used in information technology 25.040.01 Industrial automation systems in general |
| Committee | TC 91 |
| Available for Purchase | For sale in Singapore only |
| Adoption | IEC |