ISO 17470:2014
Microbeam analysis — Electron probe microanalysis — Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
OVERVIEW
ISO 17470:2014 gives guidance for the identification of elements and the investigation of the presence of specific elements within a specific volume (on a µm3 scale) contained in a specimen, by analysing X-ray spectra obtained using wavelength dispersive X-ray spectrometers on an electron probe microanalyser or on a scanning electron microscope.
COMMENTS
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PRODUCT DETAILS
| Status | Current |
|---|---|
| Edition | 2014 |
| No. of Pages | 10 |
| ICS Classification | 71.040.99 Other standards related to analytical chemistry |
| Committee | ISO/TC 202/SC 2 |
| Available for Purchase | For sale in Singapore only |
| Adoption | ISO |