ISO 18118:2015
Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
OVERVIEW
ISO 18118:2015 gives guidance on the measurement and use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials by Auger electron spectroscopy and X-ray photoelectron spectroscopy.
COMMENTS
-
PRODUCT DETAILS
| Status | Withdrawn - 28 Feb 2024 |
|---|---|
| Edition | 2015 |
| No. of Pages | 26 |
| ICS Classification | 71.040.40 Chemical analysis |
| Committee | ISO/TC 201/SC 7 |
| Available for Purchase | For sale in Singapore only |
| Adoption | ISO |