IEC 60147-2K:1978

Supplement K - Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 2: General principles of measuring methods

OVERVIEW

Gives an alternative method to that described in IEC 147-2F for measuring the main parameters of varactor diodes by means of a coaxial cavity. Describes the methods of measurement for microwave mixer diodes, i.e. in addition to measurement of d.c. parameters, those of rectified current, intermediate frequency impedance, voltage standing wave ratio, overall noise factor, output noise ratio, conversion loss, burnout energy.

COMMENTS

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PRODUCT DETAILS

Status Withdrawn - 02 Jan 2026
Edition 1978
No. of Pages 55
ICS Classification 31.080.10 Diodes
Committee TC 47
Available for Purchase For sale in Singapore only
Adoption IEC