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IEC 62525:2007

Standard Test Interface Language (STIL) for Digital Test Vector Data

OVERVIEW

Defines a test description language that: Facilitates the transfer of large volumes of digital test vector data from CAE environments to automated test equipment ATE environments; Specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a device under test (DUT); Supports the volume of test vector data generated from structured tests such as scan/automatic test pattern generation (ATPG), integral test techniques such as built-in self test (BIST), and functional test specifications for IC designs and their assemblies, in a format optimized for application in ATE environments.

COMMENTS

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PRODUCT DETAILS

Status Current
Edition 2007
No. of Pages 143
ICS Classification 19.080 Electrical and electronic testing
25.040.01 Industrial automation systems in general
Committee TC 91
Available for Purchase For sale in Singapore only
Adoption IEC