IEC 62525:2007
Standard Test Interface Language (STIL) for Digital Test Vector Data
OVERVIEW
Defines a test description language that: Facilitates the transfer of large volumes of digital test vector data from CAE environments to automated test equipment ATE environments; Specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a device under test (DUT); Supports the volume of test vector data generated from structured tests such as scan/automatic test pattern generation (ATPG), integral test techniques such as built-in self test (BIST), and functional test specifications for IC designs and their assemblies, in a format optimized for application in ATE environments.
COMMENTS
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PRODUCT DETAILS
Status | Current |
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Edition | 2007 |
No. of Pages | 143 |
ICS Classification | 19.080 Electrical and electronic testing 25.040.01 Industrial automation systems in general |
Committee | TC 91 |
Available for Purchase | For sale in Singapore only |
Adoption | IEC |