IEC 60759:1983
Standard test procedures for semiconductor X-ray energy spectrometers
OVERVIEW
Gives standard test procedures for semiconductor X-ray energy spectrometers consisting of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer.
COMMENTS
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PRODUCT DETAILS
| Status | Current |
|---|---|
| Edition | 1983 |
| No. of Pages | 97 |
| ICS Classification | 17.240 Radiation measurements |
| Committee | TC 45 |
| Available for Purchase | For sale in Singapore only |
| Adoption | IEC |