IEC 60147-2M:1980
Supplement M - Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 2: General principles of measuring methods
OVERVIEW
Deals with measuring methods for signal and voltageregulator diodes, bipolar and field-effect transistors. Some methods, formerly described, are brought up to date according to more modern techniques or equipment; some others are newly described.
COMMENTS
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PRODUCT DETAILS
| Status | Withdrawn - 02 Jan 2026 |
|---|---|
| Edition | 1980 |
| No. of Pages | 73 |
| ICS Classification | 31.080.10 Diodes |
| Committee | TC 47 |
| Available for Purchase | For sale in Singapore only |
| Adoption | IEC |