IEC 62373:2006
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
OVERVIEW
Provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET)
COMMENTS
-
PRODUCT DETAILS
| Status | Current |
|---|---|
| Edition | 2006 |
| No. of Pages | 27 |
| ICS Classification | 31.080.30 Transistors |
| Committee | TC 47 |
| Available for Purchase | For sale in Singapore only |
| Adoption | IEC |