IEC 60333:1983
Test procedures for semiconductor charged-particle detectors
OVERVIEW
COMMENTS
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PRODUCT DETAILS
| Status | Revised |
|---|---|
| Edition | 1983 |
| No. of Pages | 69 |
| ICS Classification | 17.240 Radiation measurements |
| Committee | TC 45 |
| Available for Purchase | For sale in Singapore only |
| Adoption | IEC : 0 |