ISO 22493:2014
Microbeam analysis — Scanning electron microscopy — Vocabulary
OVERVIEW
ISO 22493:2014 defines terms used in the practice of scanning electron microscopy (SEM). It covers both general and specific concepts, classified according to their hierarchy in a systematic order, with those terms that have already been defined in ISO 23833 also included, where appropriate.
ISO 22493:2014is applicable to all standardization documents relevant to the practice of SEM. In addition, some clauses of ISO 22493:2014 are applicable to documents relevant to related fields (e.g. EPMA, AEM, EDS) for the definition of terms which are relevant to such fields.
COMMENTS
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PRODUCT DETAILS
| Status | Current |
|---|---|
| Edition | 2014 |
| No. of Pages | 20 |
| ICS Classification | 01.040.37 Image technology (Vocabularies) 37.020 Optical equipment |
| Committee | ISO/TC 202/SC 1 |
| Available for Purchase | For sale in Singapore only |
| Adoption | ISO |