IEC 63616:2025
Measurement of the conductivity for metal thin films at microwave and millimeter-wave frequencies - Balanced-type circular disk resonator method
OVERVIEW
IEC 63616:2025 relates to a conductivity measurement method of thin metal films at microwave and millimeter-wave frequencies. This method has been developed to evaluate the conductivity of a metal foil used for adhering to a substrate or the interfacial conductivity of a metal layer formed on a dielectric substrate. It uses higher-order modes of a balanced-type circular disk resonator and provides broadband conductivity measurements by using a single resonator.
COMMENTS
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PRODUCT DETAILS
| Status | Current |
|---|---|
| Edition | 2025 |
| No. of Pages | 26 |
| ICS Classification | 29.050 Superconductivity and conducting materials 17.220.20 Measurement of electrical and magnetic quantities |
| Committee | TC 46/SC 46F |
| Available for Purchase | For sale in Singapore only |
| Adoption | IEC : 0 |