IEC 61967-4:2002
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions, 1 ohm/150 ohm direct coupling method
OVERVIEW
Specifies a method to measure the conducted electromagnetic emission of integrated circuits by direct RF current measurement with a 1 ohm resistive probe and RF voltage measurement using a 150 ohm coupling network. These methods guarantee a high degree of repeatability and correlation of measurements.
The contents of the corrigendum 1 of June 2017 have been included in this copy.
COMMENTS
-
PRODUCT DETAILS
| Status | Revised |
|---|---|
| Edition | 2002 |
| No. of Pages | 57 |
| ICS Classification | 31.200 Integrated circuits. Microelectronics |
| Committee | TC 47/SC 47A |
| Available for Purchase | For sale in Singapore only |
| Adoption | IEC : 0 |