IEC 60147-2C:1970
Supplement C - Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 2: General principles of measuring methods
OVERVIEW
Deals with transistors and considers collector-base capacitance of transistors, gives voltage ratings and measurable characteristics limiting the working voltages, indicates methods of measuring thermal resistance and defines switching and high- frequency parameters.
COMMENTS
-
PRODUCT DETAILS
| Status | Withdrawn - 02 Jan 2026 |
|---|---|
| Edition | 1970 |
| No. of Pages | 73 |
| ICS Classification | 31.080.10 Diodes |
| Committee | TC 47 |
| Available for Purchase | For sale in Singapore only |
| Adoption | IEC |