ISO 11505:2012
Surface chemical analysis — General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
OVERVIEW
ISO 11505:2013 describes a glow discharge optical emission spectrometric (GD-OES) method for the determination of the thickness, mass per unit area and chemical composition of surface layer films.
It is limited to a description of general procedures of quantification of GD-OES and is not applicable directly for the quantification of individual materials having various thicknesses and elements to be determined.
COMMENTS
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PRODUCT DETAILS
| Status | Withdrawn - 06 Jan 2026 |
|---|---|
| Edition | 2012 |
| No. of Pages | 33 |
| ICS Classification | 71.040.40 Chemical analysis |
| Committee | ISO/TC 201/SC 8 |
| Available for Purchase | For sale in Singapore only |
| Adoption | ISO |