IEC TS 62607-6-11:2022
Nanomanufacturing - Key control characteristics - Part 6-11: Graphene - Defect density: Raman spectroscopy
OVERVIEW
IEC TS 62607-6-11:2022(EN) establishes a standardized method to determine the key control characteristic
• defect density nD
of graphene films grown by chemical vapour deposition as well as exfoliated graphene flakes by
• Raman spectroscopy
COMMENTS
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PRODUCT DETAILS
| Status | Current |
|---|---|
| Edition | 2022 |
| No. of Pages | 27 |
| ICS Classification | 07.120 Nanotechnologies |
| Committee | TC 113 |
| Available for Purchase | For sale in Singapore only |
| Adoption | IEC |