IEC 61967-4:2002+AMD1:2006 CSV
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 O/150 O direct coupling method
OVERVIEW
Specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 O resistive probe and RF voltage measurement using a 150 O coupling network. These methods guarantee a high degree of repeatability and correlation of EME measurements. IEC 61967-1 specifies general conditions and definitions of the test methods. The contents of the corrigendum 1 of June 2017 have been included in this copy.
This consolidated version consists of the first edition (2002) and its amendment 1 (2006). Therefore, no need to order amendment in addition to this publication.
COMMENTS
-
PRODUCT DETAILS
| Status | Withdrawn - 02 Jan 2026 |
|---|---|
| Edition | 2006 |
| No. of Pages | 65 |
| ICS Classification | 31.200 Integrated circuits. Microelectronics |
| Committee | TC 47/SC 47A |
| Available for Purchase | For sale in Singapore only |
| Adoption | IEC : 0 |