ISO 21270:2004
Surface chemical analysis — X-ray photoelectron and Auger electron spectrometers — Linearity of intensity scale
OVERVIEW
ISO 21270:2004 specifies two methods for determining the maximum count rate for an acceptable limit of divergence from linearity of the intensity scale of Auger and X-ray photoelectron spectrometers. It also includes methods to correct for intensity non-linearities so that a higher maximum count rate can be employed for those spectrometers for which the relevant correction equations have been shown to be valid.
COMMENTS
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PRODUCT DETAILS
| Status | Current |
|---|---|
| Edition | 2004 |
| No. of Pages | 13 |
| ICS Classification | 71.040.40 Chemical analysis |
| Committee | ISO/TC 201/SC 7 |
| Available for Purchase | For sale in Singapore only |
| Adoption | ISO |