IEC 60512-6-2:2002
Connectors for electronic equipment - Tests and measurements - Part 6-2: Dynamic stress tests - Test 6b: Bump
OVERVIEW
Defines a standard test method to assess the ability of components (essentially connectors) to withstand specified severities of bump.
COMMENTS
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PRODUCT DETAILS
| Status | Current |
|---|---|
| Edition | 2002 |
| No. of Pages | 9 |
| ICS Classification | 31.220.10 Plug-and-socket devices. Connectors |
| Committee | TC 48/SC 48B |
| Available for Purchase | For sale in Singapore only |
| Adoption | IEC |