IEC 60333:1993
Nuclear instrumentation - Semiconductor charged-particle detectors - Test procedures
OVERVIEW
Applies to semiconductor radiation detectors which are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described have been selected to be readily available to all manufacturers and users of semiconductor charged-particle detectors.
COMMENTS
-
PRODUCT DETAILS
| Status | Withdrawn - 02 Jan 2026 |
|---|---|
| Edition | 1993 |
| No. of Pages | 76 |
| ICS Classification | 17.240 Radiation measurements |
| Committee | TC 45 |
| Available for Purchase | For sale in Singapore only |
| Adoption | IEC |