IEC 62228-2:2016
Integrated circuits - EMC evaluation of transceivers - Part 2: LIN transceivers
OVERVIEW
IEC 62228-2:2016 specifies test and measurement methods for EMC evaluation of LIN transceiver ICs under network condition. It defines test configurations, test conditions, test signals, failure criteria, test procedures, test setups and test boards. It is applicable for standard LIN transceiver ICs and ICs with embedded LIN transceiver and covers:
- the emission of RF disturbances,
- the immunity against RF disturbances,
- the immunity against impulses and
- the immunity against electrostatic discharges (ESD).
COMMENTS
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PRODUCT DETAILS
| Status | Current |
|---|---|
| Edition | 2016 |
| No. of Pages | 85 |
| ICS Classification | 31.200 Integrated circuits. Microelectronics |
| Committee | TC 47/SC 47A |
| Available for Purchase | For sale in Singapore only |
| Adoption | IEC |