IEC 60444-2:1980
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units
OVERVIEW
Describes a method of measuring the motional capacitance of quartz crystal units in the frequency range 1 MHz to 125 MHz with a total measurement error of the order of 5%.
COMMENTS
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PRODUCT DETAILS
| Status | Current |
|---|---|
| Edition | 1980 |
| No. of Pages | 18 |
| ICS Classification | 31.140 Piezoelectric devices |
| Committee | TC 49 |
| Available for Purchase | For sale in Singapore only |
| Adoption | IEC |