ISO 17901-2:2015
Optics and photonics — Holography — Part 2: Methods for measurement of hologram recording characteristics
OVERVIEW
ISO 17901-2:2015 specifies the terms and measurement method concerning exposure characteristics (exposure characteristic curve, exposure at half-maximum, R-value, amplitude of refractive index modulation) for the hologram recorded by double-beam interference. The materials of hologram to be measured are not restricted to any particular ones. ISO 17901-2:2015 does not intend to restrict manufacturing process.
COMMENTS
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PRODUCT DETAILS
| Status | Current |
|---|---|
| Edition | 2015 |
| No. of Pages | 20 |
| ICS Classification | 31.020 Electronic components in general |
| Committee | ISO/TC 172/SC 9 |
| Available for Purchase | For sale in Singapore only |
| Adoption | ISO |