IEC TS 62878-2-4:2015

Device embedded substrate - Part 2-4: Guidelines - Test element groups (TEG)

OVERVIEW

IEC TS 62878-2-4:2015 describes the test element group devices useful when measuring basic properties of device embedded substrates. It is applicable to device embedded substrates fabricated by use of organic base material, which include for example active or passive devices, discrete components formed in the fabrication process of electronic wiring board, and sheet formed components.

COMMENTS

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PRODUCT DETAILS

Status Current
Edition 2015
No. of Pages 75
ICS Classification 31.190 Electronic component assemblies
31.180 Printed circuits and boards
Committee TC 91
Available for Purchase For sale in Singapore only
Adoption IEC