IEC TR 62878-2-2:2015
Device embedded substrate - Part 2-2: Guidelines - Electrical testing
OVERVIEW
IEC TR 62878-2-2:2015 describes the necessary information on electrical testing for device embedded substrate. This includes the interconnection open- and short-circuit tests as well as the device functional test. It also provides guidelines by demonstrating the electrical test for device embedded substrate.
COMMENTS
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PRODUCT DETAILS
| Status | Current |
|---|---|
| Edition | 2015 |
| No. of Pages | 29 |
| ICS Classification | 31.190 Electronic component assemblies 31.180 Printed circuits and boards |
| Committee | TC 91 |
| Available for Purchase | For sale in Singapore only |
| Adoption | IEC |