IEC PAS 62181:2000
IC latch-up test
OVERVIEW
Establishes a method for determining IC latch-up characteristics and to define latch-up failure criteria. Applicable to NMOS, CMOS, bipolar, and all variations and combinations of these technologies.
COMMENTS
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PRODUCT DETAILS
| Status | Current |
|---|---|
| Edition | 2000 |
| No. of Pages | 19 |
| ICS Classification | |
| Committee | TC 47 |
| Available for Purchase | For sale in Singapore only |
| Adoption | IEC : 0 |