ISO 16243:2011
Surface chemical analysis — Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
OVERVIEW
ISO 16243:2011 specifies the minimum level of information to be reported by the analyst following the analysis of a test specimen using X-ray photoelectron spectroscopy (XPS). It includes information that is to be recorded on or in the analytical record.
COMMENTS
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PRODUCT DETAILS
| Status | Current |
|---|---|
| Edition | 2011 |
| No. of Pages | 9 |
| ICS Classification | 71.040.40 Chemical analysis |
| Committee | ISO/TC 201/SC 2 |
| Available for Purchase | For sale in Singapore only |
| Adoption | ISO |