ISO 24688:2022
Determination of modulation period of nano-multilayer coatings by low-angle X-ray methods
OVERVIEW
This document specifies the substrate conditions and testing of the modulation period (including the principles for low-angle X-ray methods, the requirements of the coatings, the requirements for X-ray measuring apparatus, the calibration of apparatus and samples, and the testing conditions and calculation process) of nano-multilayer coatings by low-angle X-ray methods including X-ray reflectivity (XRR) and glancing incident X-ray diffraction (GIXRD).
COMMENTS
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PRODUCT DETAILS
| Status | Current |
|---|---|
| Edition | 2022 |
| No. of Pages | 8 |
| ICS Classification | 25.220.01 Surface treatment and coating in general |
| Committee | ISO/TC 107/SC 9 |
| Available for Purchase | For sale in Singapore only |
| Adoption | ISO |