IEC 62047-50:2025
Semiconductor devices - Micro-electromechanical devices - Part 50: MEMS capacitive microphones
OVERVIEW
IEC 62047-50:2025 defines the test conditions and test methods for the performance of MEMS capacitive microphones.
This document applies to MEMS capacitive microphones.
COMMENTS
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PRODUCT DETAILS
Status | Current |
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Edition | 2025 |
No. of Pages | 13 |
ICS Classification | 31.080.99 Other semiconductor devices |
Committee | TC 47/SC 47F |
Available for Purchase | For sale in Singapore only |
Adoption | IEC : 0 |