IEC 62047-50:2025

Semiconductor devices - Micro-electromechanical devices - Part 50: MEMS capacitive microphones

OVERVIEW

IEC 62047-50:2025 defines the test conditions and test methods for the performance of MEMS capacitive microphones.

This document applies to MEMS capacitive microphones.

COMMENTS

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PRODUCT DETAILS

Status Current
Edition 2025
No. of Pages 13
ICS Classification 31.080.99 Other semiconductor devices
Committee TC 47/SC 47F
Available for Purchase For sale in Singapore only
Adoption IEC : 0