IEC 62416:2010
Semiconductor devices - Hot carrier test on MOS transistors
OVERVIEW
IEC 62416:2010 describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.
COMMENTS
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PRODUCT DETAILS
| Status | Current |
|---|---|
| Edition | 2010 |
| No. of Pages | 20 |
| ICS Classification | 31.080.30 Transistors |
| Committee | TC 47 |
| Available for Purchase | For sale in Singapore only |
| Adoption | IEC |