ISO/IEC 9834-2:1993
Semiconductor devices - Mechanical and climatic test methods
OVERVIEW
Lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made. Establishes uniform preferred test methods with preferred values for stress levels for judging the environmental properties of semiconductor devices.
COMMENTS
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PRODUCT DETAILS
| Status | Withdrawn - 02 Jan 2026 |
|---|---|
| Edition | 1993 |
| No. of Pages | 8 |
| ICS Classification | 35.100.70 Application layer |
| Committee | ISO/IEC JTC 1 |
| Available for Purchase | For sale in Singapore only |
| Adoption | IEC |