IEC 62526:2007
Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments
OVERVIEW
Provides an interface between digital test generation tools and test equipment. A test description language is defined that:(a) facilitates the transfer of digital test vector data from CAE to ATE environments;(b) specifies patten, format, and timing information sufficant to define the application of digital test vectors to a DUT;and (c) supports the volume of test vector data generated from structured tests.
COMMENTS
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PRODUCT DETAILS
| Status | Current |
|---|---|
| Edition | 2007 |
| No. of Pages | 123 |
| ICS Classification | 25.040.01 Industrial automation systems in general |
| Committee | TC 91 |
| Available for Purchase | For sale in Singapore only |
| Adoption | IEC |