ISO/TS 24597:2011

Microbeam analysis — Scanning electron microscopy — Methods of evaluating image sharpness

OVERVIEW

ISO/TS 24597:2011 specifies methods of evaluating the sharpness of digitized images generated by a scanning electron microscope by means of a Fourier transform method, a contrast-to-gradient method and a derivative method.

COMMENTS

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PRODUCT DETAILS

Status Current
Edition 2011
No. of Pages 87
ICS Classification 37.020 Optical equipment
Committee ISO/TC 202/SC 4
Available for Purchase For sale in Singapore only
Adoption ISO