IEC TS 62396-5:2008
Process management for avionics - Atmospheric radiation effects - Part 5: Guidelines for assessing thermal neutron fluxes and effects in avionics systems
OVERVIEW
IEC TS 62396-5:2008 (E) provides a more precise definition of the threat that thermal neutrons pose to avionics as a second mechanism for inducing single event upset (SEU) in microelectronics. Addresses more in detail the following: detailed evaluation of the existing literature on measurements of the thermal flux inside of airliners; an enhanced compilation of the thermal neutron SEU cross section in currently available SRAM devices (more than 20 different devices).
COMMENTS
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PRODUCT DETAILS
| Status | Current |
|---|---|
| Edition | 2008 |
| No. of Pages | 18 |
| ICS Classification | 49.060 Aerospace electric equipment and systems 31.020 Electronic components in general 03.100.50 Production. Production management |
| Committee | TC 107 |
| Available for Purchase | For sale in Singapore only |
| Adoption | IEC : 0 |