TR IEC/TS 62804-1:2019
Photovoltaic (PV) modules – Test methods for the detection of potential-induced degradation – Part 1 : Crystalline silicon
OVERVIEW
Defines procedures to test and evaluate the durability of crystalline silicon photovoltaic (PV) modules to the effects of short-term high-voltage stress including potential-induced degradation (PID).
The testing is designed for crystalline silicon PV modules with one or two glass surfaces, silicon cells having passivating dielectric layers, for degradation mechanisms involving mobile ions influencing the electric field over the silicon semiconductor, or electronically interacting with the silicon semiconductor itself. Is not intended for evaluating modules with thin-film technologies, tandem, or heterostructure devices.
Describes methods to measure the module design’s ability to withstand degradation from system voltage effects that manifest in the relatively short term.
COMMENTS
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PRODUCT DETAILS
| Status | Current |
|---|---|
| Edition | 2019 |
| No. of Pages | 22 |
| ICS Classification | 27.160 Solar energy engineering |
| Committee | Electrical and Electronic Standards Committee |
| Available for Purchase | Global |
| Adoption | IEC/TS 62804 : 2015 IDT |