IEC 62899-503-1:2020
Printed electronics - Part 503-1: Quality assessment - Test method of displacement current measurement for printed thin-film transistor
OVERVIEW
IEC 62899-503-1:2020(E) specifies a test method for displacement current measurement (DCM) for printed thin film transistors (TFTs) or organic thin film transistors (OTFTs).
COMMENTS
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PRODUCT DETAILS
| Status | Current |
|---|---|
| Edition | 2020 |
| No. of Pages | 15 |
| ICS Classification | 31.080.30 Transistors 29.045 Semiconducting materials |
| Committee | TC 119 |
| Available for Purchase | For sale in Singapore only |
| Adoption | IEC |