ISO 3274:1975

Instruments for the measurement of surface roughness by the profile method — Contact (stylus) instruments of consecutive profile transformation — Contact profile meters, system M

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PRODUCT DETAILS

Status Withdrawn - 03 Jan 2024
Edition 1975
No. of Pages 7
ICS Classification 17.040.30 Measuring instruments
Committee ISO/TC 213
Available for Purchase For sale in Singapore only
Adoption ISO