FAQs
IEC 60642-2:1994
Piezoelectric ceramic resonator units - Part 2: Guide to the use of piezoelectric ceramic...
IEC 60483:1976
Guide to dynamic measurements of piezoelectric ceramics with high electromechanical coupling
IEC 60444-9:2007
Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of...
IEC 60444-11:2010
Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination...
IEC 60404-1-1:2004
Magnetic materials - Part 1-1: Classification - Surface insulations of electrical steel sheet,...
IEC 60747-16-5:2013/AMD1:2020
Amendment 1 - Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
IEC 62047-37:2020
Semiconductor devices - Micro-electromechanical devices - Part 37: Environmental test methods...
IEC 60747-19-1:2019
Semiconductor devices - Part 19-1: Smart sensors - Control scheme of smart sensors
IEC 62047-35:2019
Semiconductor devices - Micro-electromechanical devices - Part 35: Test method of electrical...