IEC Standards

IEC 62047-10:2011

Semiconductor devices - Micro-electromechanical devices - Part 10: Micro-pillar compression...

IEC 60747-16-5:2013

Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators

IEC 60747-16-4:2004

Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches

IEC 60747-16-4:2004/AMD1:2009

Amendment 1 - Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches

IEC 60747-16-10:2004

Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave...

IEC 60444-7:2004

Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency...

IEC 60444-6:2013

Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence...

IEC 60444-5:1995

Measurement of quartz crystal units parameters - Part 5: Methods for the determination of...

IEC TR 60444-4:1988

Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 4:...