FAQs
IEC 60749:1984
Semiconductor devices - Mechanical and climatic test methods.
IEC 60749:1996/AMD2:2001
Amendment 2 - Semiconductor devices - Mechanical and climatic test methods
IEC 60749:1984/AMD2:1993
Amendment 2 - Semiconductor devices - Mechanical and climatic test methods.
IEC 60749:1996/AMD1:2000
Amendment 1 - Semiconductor devices - Mechanical and climatic test methods
IEC 60749:1984/AMD1:1991
Amendment 1 - Semiconductor devices - Mechanical and climatic test methods.
IEC 60749-7:2002/COR1:2003
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal...
IEC 60749-7:2002
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture...
IEC 60749-34:2004
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
IEC 60749-29:2003
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
