FAQs
IEC 60749-3:2002
Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual...
IEC 60749-26:2013
Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge...
IEC 60749-20:2008
Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic...
IEC 60749-20-1:2009
Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing,...
IEC 60749-18:2002
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation...
IEC 60749-17:2003
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
IEC 60634:1978
Heat test source (H.T.S.) lamps for carrying out heating tests on luminaires
IEC 60749-15:2010
Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering...
IEC 60749-13:2002/COR1:2003
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt...
