IEC Standards

IEC 60749-13:2002

Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere

IEC 60749-12:2002/COR1:2003

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 12:...

IEC 60749-12:2002

Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable...

IEC 60747-9:2007

Semiconductor devices - Discrete devices - Part 9: Insulated-gate bipolar transistors (IGBTs)

IEC 60634:1978/AMD1:1983

Amendment 1 - Heat test source (H.T.S.) lamps for carrying out heating tests on luminaires

IEC 60633:1978

Terminology for high-voltage direct current transmission

IEC 60630:1979

Maximum lamp outlines for incandescent lamps

IEC 60747-6:2000

Semiconductor devices - Part 6: Thyristors

IEC 60747-5-5:2007

Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers