FAQs
IEC 60749-13:2002
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
IEC 60749-12:2002/COR1:2003
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 12:...
IEC 60749-12:2002
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable...
IEC 60747-9:2007
Semiconductor devices - Discrete devices - Part 9: Insulated-gate bipolar transistors (IGBTs)
IEC 60634:1978/AMD1:1983
Amendment 1 - Heat test source (H.T.S.) lamps for carrying out heating tests on luminaires
IEC 60633:1978
Terminology for high-voltage direct current transmission
IEC 60630:1979
Maximum lamp outlines for incandescent lamps
IEC 60747-6:2000
Semiconductor devices - Part 6: Thyristors
IEC 60747-5-5:2007
Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers