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IEC 63616:2025
Measurement of the conductivity for metal thin films at microwave and millimeter-wave...
IEC 62047-49:2025
Semiconductor devices - Micro-electromechanical devices - Part 49: Temperature and humidity...
IEC 60749-7:2025
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture...
IEC 60749-24:2025
Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture...
ISO/IEC 29192-1:2012/AMD1:2025
Information technology - Security techniques - Lightweight cryptography - Part 1: General -...
IEC 60068-2-75:2014/AMD1:2025/COR1:2025
Corrigendum 1 - Amendment 1 - Environmental testing - Part 2-75: Tests - Test Eh: Hammer tests
